Meeting Attendees: 1) Sid Venkatesh (Boeing), 2) Peter Klein (Concepts NREC), 3) Maureen Fang (Pratt & Whitney), 4) Tahany El-Wardany (United Technologies Research Center), 5) Tom Charkiewicz (MTI Systems, Inc), 6) unknown (Sandvik Coromant), 7) Jeremy Bettinger (DMG), 8) Tom Scotton (CCAT), 9) unknown (UTRC), 10) Christopher Bahns (Virtek Visions), 11) Charles Gilman (GE Global Research), 12) Justin Lubell (Independent Quality Labs), 13) Iulian Trifan (Siemens Aerospace), 14) David Odendahl (Boeing), 15) Bengt Olsson (Sandvik Tooling), 16) Frederick Proctor (National Institute of Standards and Technology), 17) Rich Morihara (Boeing), 18) Mark Conley (Remmele Engineering), 19) Dong-Won Kim (Chonbuk National University), 20) Don Easterling (VeritasCNC Inc), 21) Matt Lloyd (CCAT), 22) Leon Xu (Boeing), 23) Robert Eriksson (Pratt & Whitney), 24) unknown (UTRC), 25) Buzz Callaghan (Independent Quality Labs), 26) Brian Kindilien (CCAT), 27) Gavin Bee (Virtek Visions), 28) Martin Hardwick (STEP Tools), 29) Jim Kreitmeyer (Siemens Automation), 30) Joe Fritz (STEP Tools), 31) Michael A Mariani (Independent Quality Labs), 32) Reg Mohan (DMG), 33) Gary Hargreaves (CNC Software, Inc), 34) Ernesto Gutierrez-Miravete (Rensselaer at Hartford), 35) Larry Maggiano (Mitutoyo America), 36) Jim Rodgers (Siemens Automation), 37) Chris Pfeifer (CCAT)
Not shown: David Loffredo (STEP Tools Inc), Bruce Weiner (Geometric Software),
Remote Attendees: Ian Stroud (EPFL, Switzerland), Magnus Lungren (KTH Sweden), Mikael Hedlind (KTH Sweden), Torsten Kjellberg (KTH Sweden)